Product Specifications
| Prod Model: |
HVS-10 |
| Markets: |
North America,South America,Eastern Europe,Southeast Asia,Africa,Oceania,Mid East,Eastern Asia,Western Europe |
Product Description
Testing Force 2.94N (0.3gf), 4.9N(0.5gf), 9.8N (1.0gf), 29.4N (3.0gf ), 49N (5.0gf), 98N(10.0)
Exchanging Scales Rockwell, Superficial Rockwell, Brinell
Min Measuring Unit 0.062μ M
Magnification of Microscope 100X(For Observation )200X(For Measurement)
Data Output Inside Printer and RS-232 Interface
Loading Control Automatically (load, keep, unload)
Net Weight 35kg
Max Height of Specimen 160mm
Power Supply AC220V± 5%, 50~60Hz
Carried Standard GB/T4340.2 Chinese Standard JJG151 Inspection Rule
Standard Accessories Objectives 40x and 10x, Vickers Indenter, Microscope 10x, V Testing Table, Forcipate Testing Table, Power Cable, Standard Hardness Brocks 2 PCS, etc.
Mitech is a manufacturer specializes in Non-Destructive Testing (NDT) instruments. Located in Beijing, Mitech has a professional engineer team devoted in R&D and manufacturing advanced high technical instrument; Its main products are ultrasonic digital flaw detectors, portable metal hardness testers, handle ultrasonic thickness gauges, and coat thickness gauges etc.
Until now, Mitech has distributors dispersed in major cities of China and offers excellent after-sale service. Mitech's instruments are widely used in domestic generating industry, petroleum and chemical industry, pressure vessel manufacturing industry and so on, for providing quality control procedure; Customers are satisfied with the high-quality, good reliability and its prompt after-sale services.
Mitech's mission is to provide customers with the best products and services, make contributions to the development of our world, the company is active in communicating with our distributors and customers both present and potential, main conversions and exhibitions of non-destructive testing are good chances for people to know more about Mitech and its products. Mitech welcomes to join hands with more friends.
